Full Day Agenda
This year’s program is packed with expert-led sessions, real-world case studies, and hands-on insights into the latest trends in electromagnetic compatibility. Whether you're focused on testing, compliance challenges, or emerging EMC technologies, there’s something for every engineer and industry professional at Exploring EMC 2025!
Start
Finish
Activity
Duration
08:45
09:15
Registration / Arrival
30 mins
09:15
09:30
Welcome to Exploring EMC 2025
15 mins
09:30
10:15
Ryan Fergus | ETS Lindgren
The Future of Reverb Testing and Why Everybody Should Be Interested
The use of reverberation chambers have typically been associated to applications such as Automotive and Defence/Aerospace testing where the very high field strengths are required and a conventional Semi Anechoic Chamber is not always practical. However, reverberation chambers are actually widely used for a range of test applications which not only includes EMC but also antenna characterization, over-the-air tests for wireless systems, and characterization of materials, among others. This presentation provides some background into the uses and benefits of reverberation chambers and why this test environment may be applicable to your application.
45 mins
10:15
10:45
Exhibition / networking / refreshments - morning tea / coffee
30 mins
10:45
11:15
Simon Hindle | TUV SUD
Integrating 'Certified' Modules: Understanding Manufacturer Obligations under EU and FCC Regulations
TUV often find that manufacturers have misunderstood or underestimated their regulatory responsibilities when integrating third-party certified modules into their products. It's a common surprise when they learn that modular approval does not automatically ensure compliance for the final product.
This session will explore the obligations placed on manufacturers by both EU and FCC regulations. It will highlight where to find the relevant guidance and how to interpret and apply it effectively during product development.
Key topics include:
- Where to find official EU and FCC guidance
- How to read and interpret grant conditions
- Module integration checks and validation
- Co-location and simultaneous transmission considerations
- RF exposure and SAR compliance implications
- Conformity assessment procedures (CE marking, FCC Certification)
- Change in ID, C2PC (Class II Permissive Change), and re-certification scenarios
Attendees will gain practical insight into navigating compliance requirements, avoiding costly oversights, and ensuring their end products remain within the scope of regulatory approvals.
30 mins
11:15
11:45
John de Rooij | Raditeq
Beyond Automation: Ensuring Reliable and Accurate EMC Immunity Testing
This session will explore how automation enhances EMC immunity testing through increased consistency and efficiency, but also the risks it introduces, such as undertesting and overtesting. Attendees will learn practical strategies for managing these challenges, including best practices for data integrity, meeting ISO 17025 requirements, and verifying test system performance. Key topics include equipment validation, signal stability, and the importance of accurate field measurements.
By the end of the session, participants will understand how to improve test reliability, reduce compliance risks, and adapt to evolving industry demands.
30 mins
11:45
12:15
Exhibition / networking / refreshments
30 mins
12:15
13:00
Yoram Shimoni | Y.I.C. Technologies
Exploring EMC/EMI Issues with Real Time Scanning Techniques
In this presentation, we will explore common high-speed PCB design faults that can lead to EMI/EMC issues. Using a set of electronic boards, we will experimentally demonstrate some of the most typical mistakes that PCB designers may introduce in new designs
10 simple circuits have been designed to demonstrate potential design flaws every designer can face.
During the live session we will explore the following issues:
- IC Decoupling
- Crosstalk at the Component Level
- Shielding Leakage
- Effect of Ferrite in Signal Paths
- Slots in Ground Planes
- Trace on Board Edge
- Controlling Current Path
- How Layout Changes Filter Behaviour
- Near Field Communications (NFC)
45 mins
13:00
14:00
Lunch and Networking
1 hour
14:00
15:15
James Pawson | Unit 3 Compliance
Electro Static Discharge - An Illustrated Overview
James will give an overview of ESD phenomena, testing, and protection. Starting from the basics of charge accumulation and charge transfer, through discharge models, current paths, test setups, and on to typical problems and their solutions.
1 hour 15 minutes
15:15
15:45
Exhibition / networking / refreshments
30 mins
15:45
16:15
Q&A
Thank you and event close
30 mins
16:15
17:00
Exhibition / networking / access to musuem
Venue will close to attendees at 17:00
45 mins