Exploring EMC 2025

James will give an overview of ESD phenomena, testing, and protection. Starting from the basics of charge accumulation and charge transfer, through discharge models, current paths, test setups, and on to typical problems and their solutions.

TUV often find that manufacturers have misunderstood or underestimated their regulatory responsibilities when integrating third-party certified modules into their products. It's a common surprise when they learn that modular approval does not automatically ensure compliance for the final product.

This session will explore the obligations placed on manufacturers by both EU and FCC regulations. It will highlight where to find the relevant guidance and how to interpret and apply it effectively during product development.

Key topics include:

Attendees will gain practical insight into navigating compliance requirements, avoiding costly oversights, and ensuring their end products remain within the scope of regulatory approvals.

The use of reverberation chambers has typically been associated with applications such as Automotive and Defence/Aerospace testing, where very high field strengths are required and a conventional semi-anechoic chamber is not always practical.

However, reverberation chambers are actually widely used for a range of test applications which not only includes EMC but also antenna characterisation, over-the-air tests for wireless systems, and characterisation of materials, among others.

This presentation will provide attendees with some background into the uses and benefits of reverberation chambers and why this test environment may be applicable to your applications.

This session will explore how automation enhances EMC immunity testing through increased consistency and efficiency, but also the risks it introduces, such as undertesting and overtesting. Attendees will learn practical strategies for managing these challenges, including best practices for data integrity, meeting ISO 17025 requirements, and verifying test system performance. Key topics include equipment validation, signal stability, and the importance of accurate field measurements.

By the end of the session, participants will understand how to improve test reliability, reduce compliance risks, and adapt to evolving industry demands.

In this session, Yoram will explore common high-speed PCB design faults that can lead to EMI/EMC issues. Using a set of electronic boards, Yoram will experimentally demonstrate some of the most typical mistakes that PCB designers may introduce in new designs.

During the live session Yoram will explore the following issues: 

10 simple circuits have been designed to demonstrate potential design flaws every designer can face, giving attendees some practical tips to take away and implement in their own designs.