HRE-03/6G

EMC scanner system in 3D including probe kit for 6 GHz

The HRE series comes in two different sizes to fit most DUTs and combine ultra-high scan resolution of 25 μm with probe head rotation, and the best-in-class scanning SW to deliver powerful visualization of the EMC test. An optional IC scan kit, with dedicated inspection camera and high resolution near-field probes, lets you even scan for emission and immunity hotspots inside an IC.

Key Features:

In R&D

Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct.

If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.

Similarly, if your problem was immunity, you can (optionally) scan for sensitive areas and repeat measurements while strengthening your product.

You can compare different design solutions and make comparative measurements of electromagnetic emissions. You can even analyze the EMI-noise inside an IC or a compact module, thanks to the ultra-high-resolution step size (25 μm)

In Q&A

The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier of a component doesn’t affect the emission spectra in a negative way.