MACS/D
MACS/D
ETS-Lindgren
MACS/D (Magnetic Active Compensation System) for Electron Microscopy
Advanced Magnetic Compensation for Electron Microscopy
MACS/D for electron microscopy is engineered to protect high-resolution charged-beam instruments from performance-degrading magnetic interference. Its digital signal processing architecture provides rapid, low-noise compensation across a wide frequency range, enabling instruments to operate at peak stability even in challenging environments. The system supports flexible coil geometries and includes ACR technology, allowing the probe to be positioned away from interfering sources without sacrificing attenuation.
Key advantages include:
- High-power, three-axis compensation for extreme EMI environments
- Ultra-low latency DSP engine for precise, real-time corrections
- Secure remote access with monitoring, diagnostics, and data logging
- Wide dynamic range for sites with fluctuating or high-amplitude magnetic fields
This robust platform delivers long-term performance, flexible integration, and superior protection for microscopes and other sensitive electron-beam systems.
Click below to request a quote for this item. Or for product advice, stock and lead time enquiries call our team on 0330 313 3220.
| Attribute | Value |
|---|---|
| Dimensions | 53.3 cm x 22.9 cm x 43.2 cm (21 in x 9 in x 17 in) |
| Weight | 27.3 kg (60 lb) |
| Frequency Range | 0.8 mHz to 500 Hz; ACR .01 to 10 Hz |
| Max Input Power | 95 to 125V or 210 to 240 AC (50/60Hz), 15A / 10A Maximum |
| Noise Floor | <0.3 nT (3.0 μG) rms, Determined Primarily by Sensor Noise Contribution; Optionally 0.15 uT (1.5 μG) with Low Noise Probe |
| Monitor Function |
X, Y, Z Axial Fields (Absolute Magnitude) |
| Product Category | Shielded Room/Systems |
| Attribute | Value |
|---|---|
| Data Sheet | Click here to view |
