Precision in Power Conference 2026

The Precision in Power Conference, co-organised with Tektronix, will bring together industry experts for a full day of technical sessions and live demonstrations. This free, one-day event will offer a practical understanding of today’s engineering challenges and the tools required to solve them.

Delegates will also have access to a dedicated hands-on demonstration and networking area, where the latest test and measurement technologies will be available for live exploration. This interactive space is designed to bridge theory and practice, enabling attendees to:

• Engage directly with cutting-edge instrumentation
• Observe live demonstrations of advanced power analysis techniques
• Discuss real-world application challenges with technical specialists
• Gain practical understanding of system performance optimisation

This relaxed environment will enable attendees to connect with peers, exchange perspectives on emerging trends, and build relationships across the wider engineering community, with refreshments being served throughout the day.

Tuesday, 21 April 2026

09:00 - 17:00

The British Motor Museum, Gaydon

Please note, you will be taken to the Tektronix website to complete your registration.

Start

Finish

Session

Duration

09:00

09:30

Arrival, registration and welcome coffee

30 mins

09:30

09:30

Opening keynote speech

Guest speaker to be announced soon!

30 mins

10:00

10:15

Demo station access and networking time

20 mins

10:20

11:00

Unlocking Battery Health: Advanced Test Workflows & High Speed EIS

Presented by Guido Eckers - Product Manager at EA Elektro-Automatik

This session explores how today's most advanced battery test workflows are designed from single-cell characterisation all the way through module and pack validation. Attendees will discover how Rapid EIS and precision sourcing technologies dramatically accelerate the understanding of cell health, ageing behaviour, and performance variability. The session also highlights how these fast, accurate techniques are applied across both R&D environments and high-throughput manufacturing test setups. 

40 mins

11:00

11:30

Demo station access and networking time

30 mins

11:30

12:15

Precision at Speed: Python-Driven Automation for Double-Pulse Testing

Presented by Sushil Vohra - RF/EW Applications Engineer at Tektronix

This session introduces how Python-based automation transforms Double Pulse Testing (DPT)- a critical method for analysing the dynamic switching behaviour of power semiconductor devices, especially SiC and GaN technologies. Attendees will learn how automated DPT ensures consistent extraction of key switching parameters, including switching energy, dv/dt, di/dt, and voltage/current overshoot. The session also demonstrates how software-driven workflows streamline device comparison, support regression testing, and accelerate engineering insight-all without sacrificing measurement fidelity.

30 mins

12:15

13:15

Lunch, demo station access and networking time

60 mins

13:15

14:00

From Noise to Accuracy: Optimising Shunt-Based Current Measurement

Presented by Pierre Dupont - Field Applications Engineering Manager at Tektronix

This session explores the key challenges of measuring fast, low-level currents in modern power electronics and the techniques that ensure accurate, trustworthy results. Attendees will learn when shunt-based measurement methods are the preferred approach, how isolation and bandwidth influen­ce performance, and how to minimise noise and common sources of error. The session provides practi­cal guidance for achieving high-fidelity current measurements in demanding switching environments.

45 mins

14:00

14:15

Demo station access and networking time

15 mins

14:15

15:00

The Impact of Phase Errors in Power Measurement

Presented by Roy Hali, Senior Application Engineer HIOKI Europe

Power Analysers are key measurement devices to validate the performance of designs, but frequency dependence of current sensing is becoming the cause of measurement errors. With the increasing use of SiC and GaN semiconductors in power electronics, switching frequencies have risen, which increases the impact of phase errors on accurate power measurement. This can lead to inconsistent power efficiency measurements and in some cases even efficiencies that exceed 100%.

In this session, Roy will address what phase errors are, how they affect measurements, and what you can do to avoid them and can get accurate and repeatable measurements.

45 mins

15:00

15:30

Demo station access and networking time

30 mins

15:30

16:15

From Manual Variability to Machine-Level Precision: Automated Device Characterisation

Presented by Derek MacLachlan, Staff Applications Engineer at Tektronix

This session explores how automated approaches transform power semiconductor characterisation by standardising workflows, reducing test variability, and enabling consistent comparison of device behaviour across operating conditions. Attendees will learn how automated test processes reveal dee­per insight into performance limits, switching behaviour, and device-to-device variability. The session highlights how automation accelerates design confidence, streamlines validation, and ensures more reliable engineering decisions. 

45 mins

16:15

17:00

Q&A Session with all panellists

Venue will close to attendees at 17:00

45 mins