
3561-01
3561-01
Hioki
Battery HiTester, Built in GP-IB Interface
This product is available in 5-7 weeks
Battery Tester for High-Speed Production Line Testing of Small Battery Packs for Mobile Devices
Hioki benchtop battery testers support simultaneous high-speed measurement of internal resistance and battery voltage for the ever-expanding production lines of increasingly larger lithium-ion low resistance batteries, and other battery packs for high voltage applications. The 3561 is a wide range 300 mΩ to 3Ω/20V DC battery internal resistance tester for high-speed production line testing of small secondary batteries.
Key Features
- High-speed testing for production lines of small battery packs for mobile and portable communications devices
- Measure internal resistance and battery voltage
- For process control such as in high-speed automated assembly lines (*1)
- Measure from 0.01 mΩ to 3.1 Ω
- Measure from ± 0.1 mV DC to ± 19.9999 V DC
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Attribute | Value |
---|---|
Power Supply | 100 to 240 VAC, 50/60 Hz, 30 VA max. |
Dimensions and Weight | 6 VDC (resolution 10 μV) to 300 VDC (resolution 1 mV), 3 ranges |
Included Accessories | Instruction manual ×1, Power cord ×1 |
Display | 31000 full digits (resistance), 600000 full digits (voltage), LED |
Other Functions |
Judgment result: Hi/IN/Lo (resistance and voltage judged independently) Setting: Upper and lower limit, Deviation (%) from reference value Logical ANDed result: PASS/FAIL, calculates the logical AND of resistance and voltage judgment results. Result display, beeper, or external I/O output, Open-collector (35 V, 50 mA DC max.) |
Interfaces | External I/O, RS-232C, Printer (RS-232C), GP-IB (-01 suffix models only) |
Accuracy | ± 0.01% rdg. ± 3 dgt. (Add ± 3 dgt. for EX.FAST, or ± 2 dgt. for FAST and MEDIUM) |
Sampling Rate |
Four steps, 4 ms (Extra-FAST), 12 ms (FAST), 35 ms (Medium), 150 ms (Slow) (Typ., sampling time depends on supply frequency settings and function.) |
Analogue Output | Measured resistance (displayed value, from 0 to 3.1 V DC, -01 suffix models only) |
Resistance Measurement Ranges |
3 mΩ (Max. display 3.1000 mΩ, resolution 0.1 μΩ) to 3000 Ω (Max. display 3100.0 Ω, resolution 100 mΩ), 7 ranges Accuracy: 30 mΩ to 3000 Ω ranges, ± 0.5% rdg. ± 5 dgt. (Add ± 3 dgt. for EX.FAST, or ± 2 dgt. for FAST and MEDIUM) 3 mΩ range, ± 0.5% rdg. ± 10 dgt. (Add ± 30 dgt. for EX.FAST, or ± 10 dgt. for FAST, or ± 5 dgt. for MEDIUM) Testing source frequency: 1 kHz ± 0.2 Hz, testing current: 100 mA (3 mΩ range) to 10 μA (3000 Ω range) Open-circuit Voltage: 25 V peak (3/30 mΩ ranges), 7 V peak (300 mΩ range), 4 V peak (3 Ω to 3000 Ω ranges) |
Voltage Measurement Ranges | 6 VDC (resolution 10 μV) to 300 VDC (resolution 1 mV), 3 ranges |
Measurement Time |
Response time + sampling rate, approx. 10 ms for measurements (Response time depends on reference values and the measurement object.) |
Comparator Functions |
Judgment result: Hi/IN/Lo (resistance and voltage judged independently) Setting: Upper and lower limit, Deviation (%) from reference value Logical ANDed result: PASS/FAIL, calculates the logical AND of resistance and voltage judgment results. Result display, beeper, or external I/O output, Open-collector (35 V, 50 mA DC max.) |
Max. Applied Measurement Voltage |
± 300 V DC rated input voltage |
Attribute | Value |
---|---|
Data Sheet | Click here to view |