RM3545-02
RM3545-02
Hioki
Ohmmeter, 4-Wire, 10mohm to 1000Mohm, 0.01 µohm, 1 A, ± 0.006% rdg, 80 mm
Auto-scanning and step-scanning
When using the Hioki Multiplexer Unit Z3003 to perform scanning measurements, you can select either step scanning or auto scanning depending on the test conditions. Auto scanning is convenient when you require only an overall judgment result after scanning, while step scanning is convenient when you wish to generate judgments in real-time using the instrument’s EXT I/O interface.
Comparator judgments based on measurement results
Measurement targets that are susceptible to the effects of temperature, for example, thermistors and temperature transducers, can be compared with a reference element to generate a judgment.
Flexible pin assignments
The ability to freely combine pins for each channel makes it possible to perform measurements using wiring that has been optimised for a variety of measurement targets.
Acquiring Total judgment results from EXT I/O
The multiplexer’s total judgment result (T_PASS, T_FAIL, T_ERR) can be acquired from EXT I/O. Similarly, step scan judgment results can be acquired for each step.
Configuration using a computer
Multiplexer settings can be configured using the keys on the instrument, communications commands, or a computer application (sample PC application).
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| Attribute | Value |
|---|---|
| Absolute Accuracy | ±0.006% of reading ±0.001% full scale |
| Interface | GP-IB, RS-232C, USB |
| Attribute | Value |
|---|---|
| Data Sheet | Click here to view |
