3DPM0168

Advanced high performance semiconductor devices can be sensitive to Single Event Latch-Up (SEL) effect when exposed under radiation in the space environment. Even if SEL is a very rare event, it can lead to a self destruction of the device and shall be mitigated to ensure the relevant reliability and life time of the application. Therefore, a safe design for a mission critical space application shall include a protection device called the Latch-Up current Limiter (LCL).

The 3DPM0168 LCL monitors the power supply line of the semiconductor device and switches it off instantaneously in case of any overvoltage or "radiation induced SEL" in order to protect the device from over current and overheating. Featuring specific radiation effect mitigation techniques and utilising space design de-rating rules, the Rad Hard by Design 3DPM0168 LCL is an ITAR Free product and features a SEL/SEE LETth of 80 MeV.cm²/mg and a TID of 50 krad (Si).

The 3DPM0168 is manufactured with 3D PLUS Space Qualified stacking technology designed for for high reliability applications, and is available in a compact size and low weight 20-pin SOP package.