The Tektronix AFG31000 Series is a high-performance AFG with built-in arbitrary waveform generation, real-time waveform monitoring, and the largest touchscreen on the market. Providing advanced waveform generation and programming capabilities, waveform verification, and a modern touch-screen interface, the new AFG31000 is sure to delight and simplify the job of every researcher and engineer.
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Patented InstaView™ technology enables engineers to see the actual waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance
Sequencing option adds the ability to program long, complex waveforms with up to 256 steps
The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings
Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC
Outputs are protected from over voltage and current to minimize potential instrument damage
Built-in Double Pulse Test application to generate voltage pulses with varying pulse widths onto the DUTs
Channels
2
Sample Rate
500 MS/s
Record Length
16 MSa/ch
Key Performance Specifications
1 or 2 channel models
Output amplitude range 1 mVP-P to 10`VP-P into 50`Ω loads
Basic (AFG) mode:
25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms
250 MSa/s, 1 GSa/s or 2 GSa/s sample rates
14-bit vertical resolution
Built-in waveforms include sine, square, ramp, pulse, noise, and other frequently used waveforms
Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and PWM)
Advanced (Sequence) mode:
Continuous mode (optional Sequence, Triggered and Gated modes)
16 Mpts arbitrary waveform memory on each channel (128 Mpts optional)
Up to 256 steps in sequence mode with loop, jump and wait events
Variable sampling clock 1 µSa/s to 2 GSa/s
Output Frequency (GHz)
50 MHz
Vertical Resolution
14-bit
Applications
Advanced research
Clock and system synchronization
Replication of real world signals
Component and circuit characterization and validation
