Hioki FA1240-6x | APC Technology Group

FA1240-6x

FA1240-6x

Hioki

Flying Probe Tester

Electrical Testing Verifies Correct Mounting - Populated Board Testing System

Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.

Key Features

  • Quickly complete programs that take into account component height
  • Automatically calculate arm interference (when used with the UA1780)
  • Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
  • High-speed testing at up to 0.025 sec./step
  • Proprietary Hioki lead float detection reliably detects issues up to and including pseudo-contact
  • Provides a superior level of solder quality assurance
  • Phase-isolated measurement and guarding functionality are ideal for analog circuits
  • Support for active testing (optional feature)
  • Large testing area of 510 × 460 mm (FA1240-61)
  • Automatic alignment function and simple visual test function
Contact us for lead time

Click below to request a quote for this item. Or for product advice, stock and lead time enquiries call our team on 0330 313 3220.

More Information
Attribute Value
Power Supply

FA 1240-61, FA1241-61: 200 V AC (single-phase), 50/60 Hz, 6 kVA (FA1241: 230 V AC)

FA1240-63: 200 V AC (single-phase), 50/60 Hz,5 kVA

Number Of Arms 4 (L, ML, MR, R)
Number Of Test Steps 40,000 (max.)
Test Parameters And Measurement Ranges

Resistance: 400 μΩ to 40 MΩ

Capacitance: 1 pF to 400 mF

Inductance: 1 μH to 100 H

Diode VZ measurement: 0 to 25 V

Zener diode VZ measurement: 0 to 25 V, 25 to 80 V (optional feature)

Digital transistors: 0 to 25 V

Photo couplers: 0 to 25 V

Short: 0.4 Ω to 400 kΩ

Open: 4 Ω to 40 MΩ

DC voltage measurement: 0 to 25 V

Total Probing Precision

Within ±100 μm for each arm (X and Y directions)

Within ±50 μm (probing positions)

Measurement Times

FA1240-61, FA1241-61: Max. 0.025 sec./step

FA1240-63: Max. 0.025 sec./step

Inter-Probe Pitch

FA1240-61, FA1241-61: Min. 0.15 mm

FA1240-63: Min. 0.5 mm (when using 4-terminal probes) Min. 0.15 mm Min. 0.5 mm (when using 4-terminal probes)

Maximum Testable Area

FA1240-61, FA1241-61: 510 mm (20.08 in) W × 460 mm (18.11 in) D

FA1240-63: 400 mm (15.75 in) W × 330 mm (12.99 in) D

More Information
Attribute Value
Data Sheet Click here to view

Related Products

  1. UA1781
  2. UA1801
  3. FA1816
  4. UA1782
  5. FA1221