
FA1221
FA1221
Hioki
Short-Open Tester
Multichannel short/open tester that can be embedded in existing test equipment
The FA1221 is a multichannel short/open 4-wire test equipment for populated board testing. Its small form factor lets you embed the unit into existing systems, which helps reduce installation time and costs.
Key Features
- Functionality has been consolidated in a single, desktop tower that can be easily embedded in existing equipment
- Specifically designed for short/open testing
- Four-terminal low-resistance measurement for stable measurement of low resistance
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Attribute | Value |
---|---|
Power Supply | 100 to 240 V AC (±10%), single-phase, 50 Hz / 60 Hz, max. 130 W |
Included Accessories | Instruction manual ×1, Test leads ×1, Power cord ×1, Metal fittings ×1, Installation CD ×1 |
Number Of Test Points | 128 pins (during 4-terminal measurement, up to 32 sets) |
Number Of Test Steps |
Round-robin short/open : 128 pins Component data: Max. 10000 steps Charge data: 40 sets Pin contact data: 128 pins Group data: 255 groups |
Test Parameters And Measurement Ranges |
Round-robin short/open: 4 Ω to 400 kΩ (Default: 40 Ω) Component tests: Possible |
Component Tests |
Resistance: 400 μΩ to 40 MΩ Open: 4 Ω to 4 MΩ Short: 400 mΩ to 40 Ω |
Test Signals |
DC constant voltage: 100 m / 400 mV : 2 ranges DC constant current: 2 m / 20 mA, 2 ranges |
Judgment Range | -99.9% to +999.9% or absolute value |
Measurement Times |
Round-robin short/open: From approx. 0.8 ms per pin Component: From approx. 0.9 ms per step |
Statistics Functionality | Defect rate tabulation and graph display test, group, and overall; component test histogram; operating time cumulative and subtotal displays |
External I/O | Using I/O Board E4220 (*1) : 60 inputs, 56 outputs |
Scanner Unit | 128 channels/board (2-/4-terminal switchable, no guarding) |
Measurement Unit |
DC ammeter: Ammeter 80 μ / 800 μ / 4 m / 40 m Arms, 4 ranges DC ammeter: 250 n / 2.5 μ / 25 μ / 250 μ / 2.5 m / 25 m A f.s., 6 ranges |
Attribute | Value |
---|---|
Data Sheet | Click here to view |