FA1240-6x
FA1240-6x
Hioki
Flying Probe Tester
Electrical Testing Verifies Correct Mounting - Populated Board Testing System
Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.
Key Features
- Quickly complete programs that take into account component height
- Automatically calculate arm interference (when used with the UA1780)
- Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
- High-speed testing at up to 0.025 sec./step
- Proprietary Hioki lead float detection reliably detects issues up to and including pseudo-contact
- Provides a superior level of solder quality assurance
- Phase-isolated measurement and guarding functionality are ideal for analog circuits
- Support for active testing (optional feature)
- Large testing area of 510 × 460 mm (FA1240-61)
- Automatic alignment function and simple visual test function
Click below to request a quote for this item. Or for product advice, stock and lead time enquiries call our team on 0330 313 3220.
| Attribute | Value |
|---|---|
| Power Supply |
FA 1240-61, FA1241-61: 200 V AC (single-phase), 50/60 Hz, 6 kVA (FA1241: 230 V AC) FA1240-63: 200 V AC (single-phase), 50/60 Hz,5 kVA |
| Number Of Arms | 4 (L, ML, MR, R) |
| Number Of Test Steps | 40,000 (max.) |
| Test Parameters And Measurement Ranges |
Resistance: 400 μΩ to 40 MΩ Capacitance: 1 pF to 400 mF Inductance: 1 μH to 100 H Diode VZ measurement: 0 to 25 V Zener diode VZ measurement: 0 to 25 V, 25 to 80 V (optional feature) Digital transistors: 0 to 25 V Photo couplers: 0 to 25 V Short: 0.4 Ω to 400 kΩ Open: 4 Ω to 40 MΩ DC voltage measurement: 0 to 25 V |
| Total Probing Precision |
Within ±100 μm for each arm (X and Y directions) Within ±50 μm (probing positions) |
| Measurement Times |
FA1240-61, FA1241-61: Max. 0.025 sec./step FA1240-63: Max. 0.025 sec./step |
| Inter-Probe Pitch |
FA1240-61, FA1241-61: Min. 0.15 mm FA1240-63: Min. 0.5 mm (when using 4-terminal probes) Min. 0.15 mm Min. 0.5 mm (when using 4-terminal probes) |
| Maximum Testable Area |
FA1240-61, FA1241-61: 510 mm (20.08 in) W × 460 mm (18.11 in) D FA1240-63: 400 mm (15.75 in) W × 330 mm (12.99 in) D |
| Attribute | Value |
|---|---|
| Data Sheet | Click here to view |
