FA1811
FA1811
Hioki
Flying Probe Tester
Meeting Ever Increasing Demands for Greater Analytical Power, Faster Testing Speeds and Reduced Costs
Designed specifically for package board testing, the FA1811 achieves both high-precision contact with a total probing precision of 10 μm, and a testing speed rivaling generic flying probe testers to meet ever increasing demands for greater analytical power, faster testing speeds and reduced costs.
Key Features
- Achieve both high precision contact and high-speed probing in a space of 10 μm.
- Double test method delivers an operation rate of 100%.
- Full-net insulation continuity test using resistance: x10 max. speed*
- High-speed test using capacitance: x2 max. speed
Click below to request a quote for this item. Or for product advice, stock and lead time enquiries call our team on 0330 313 3220.
| Attribute | Value |
|---|---|
| Power Supply |
200 V AC ±10% (three phase) 50/60 Hz (200 V, 220 V AC: specified upon order) Maximum power consumption: 5 kVA |
| Notes |
Test fixture CP1165-11 Specifications: Designed for each board Vacuum unit for capacitance test E4101 Specifications: To accommodate the entire range of substrate thickness, it is necessary to replace the spacer for substrate thickness adjustment. |
| Number Of Arms | 2 (Upper: 2) |
| Compatible Probes | CP1073 series |
| Test Parameters And Measurement Ranges |
Resistance measurement : 400.0 μΩ to 40.00 MΩ 4.000 Ω to 4.000 MΩ (T) Capacitance measurement : 100.0 fF to 10.00 μF MLCC measurement : 100.0 nF to 100.0 μF Insulation measurement : 1.000 kΩ to 100.0 GΩ 1.000 kΩ to 250.0 MΩ (T) Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ High-voltage resistance measurement : 1.000 kΩ to 100.0 GΩ 1.000 kΩ to 250.0 MΩ (T) Leak current measurement : 1.000 μA to 10.00 mA Continuity : 400 mΩ to 1.000 kΩ Open measurement : 4.000 Ω to 4.000 MΩ Short measurement : 400.0 mΩ to 40.00 kΩ |
| Judgment Range | -99.9% to +999.9% or absolute value |
| Total Probing Precision | 10 μm (Square) |
| Minimum Pad Pitch | Min. 40 μm (when using CP1073-01) |
| Probing Area | 75 mm (2.95 in) × 75 mm (2.95 in) |
| Clamp Method | Follow option on BGA side |
| Board Dimensions |
Test fixture CP1165-11 Specifications: Square 10 mm (0.39 in) to Square 80 mm (3.15 in) Vacuum unit for capacitance test E4101 Specifications: 50 mm (1.97 in) W × 90 mm (3.54 in) D to 105 mm (4.13 in) × 250 mm (9.84 in) |
| Supported Range Of Board Thicknesses For Clamping |
Test fixture CP1165-11 Specifications: 0.1 mm (0.004 in) to 5.0 mm (0.20 in) Vacuum unit for capacitance test E4101 Specifications: 0.1 mm (0.004 in) to 0.8 mm (0.031 in) |
| Board Clamping |
Test fixture CP1165-11 Specifications: Holder, shutter, and vacuum pump required separately Vacuum unit for capacitance test E4101 Specifications: Vacuum pump E4106 required separately |
| Supported Pad Diameter | Test Fixture CP1165-11 Specifications: 200 μm or larger, 300 μm or larger when using Kelvin probe |
| Max. Number Of Pins | Test Fixture CP1165-11 Specifications: 8192 |
| Attribute | Value |
|---|---|
| Data Sheet | Click here to view |
