FA1815-20
FA1815-20
Hioki
Flying Probe Tester
Improved efficiency and reliability take board production to the next level
With remarkable progress in IT technology driving the semiconductor industry forward, reliability and productivity have become indispensable. Flying probe testers have long been the industry standard tool for PCB inspection.
However, as inspection demands grow more stringent, the FA1815-20 emerges as the next-generation flying probe tester, ready to meet the challenges of precision and speed head-on.
Moreover, this tester introduces an innovative approach to insulation resistance inspection that minimises some cautious users’ concern about board damage with high-voltage testing in high-resistance inspections. This advancement represents Hioki's commitment to providing market-leading solutions that contribute to societal progress.
Key Features
Improved takt time due to market-leading technology
High reliability due to high probing precision
Insulation testing up to 100 GΩ is enabled with an applied 10 V
Click below to request a quote for this item. Or for product advice, stock and lead time enquiries call our team on 0330 313 3220.
| Attribute | Value |
|---|---|
| Power Supply |
200 V, 220 V, 230 V, 240 V AC single-phase (specified at time of order); 50/60 Hz; maximum power consumption: 5 kVA |
| Measurement Speed | Max. 100 points/sec. (0.15 mm movements, 4-arm simultaneous probing, capacitance measurement) |
| Number Of Arms | 4 (2 each, top and bottom) |
| Compatible Probes | 1172 series, CP1072 series, CP1073 series |
| Number Of Test Steps | Max. 4,000,000 steps |
| Test Parameters And Measurement Ranges |
DC constant-current continuity measurement:400.0 mΩ to 1.000 kΩ DC constant-current resistance measurement: 40.00 μΩ to 400.0 kΩ DC constant-voltage resistance measurement: 4.000 Ω to 40.00 MΩ Insulation resistance measurement: 1.000 kΩ to 100.0 GΩ Low voltage insulation resistance measurement: 1.000 MΩ to 100.0 GΩ AC constant-voltage capacitance measurement: 100.0 fF to 10.00 μF Leakage current measurement: 1.000 μA to 100.0 mA High-voltage resistance measurement: 1.000 kΩ to 100.0 GΩ Capacitor insulation measurement: 1.000 kΩ to 250.0 MΩ Open measurement: 4.000 Ω to 4.000 MΩ Short measurement: 400.0 mΩ to 40.00 kΩ |
| Judgment Range | -99.9% to +999.9% or absolute value |
| Movement Resolution | XY: 0.1 μm/pulse; Z: 1 μm/pulse |
| Minimum Pad Pitch |
Top surface: 34 μm (with CP1075-09) Bottom surface: 44 μm (with CP1075-09) |
| Minimum Pad Size |
Top surface: 4 μm square (with CP1075-09) Bottom surface: 14 μm square (with CP1075-09) |
| Testable Board Size |
Thickness : 1 mm (0.04 in.) to 12 mm (0.47 in.) Outer dimensions : 50 mm (1.97 in.) W × 50 mm (1.97 in.) D to 340 mm (13.39 in.) W × 340 mm (13.39 in.) D |
| Maximum Testable Area | 340 mm (13.39 in.) W × 340 mm (13.39 in.) D |
| Clamp Method |
Flexible Fixture Vacuum Unit for Capacitance Test (Options) |
| Air Requirements |
Primary-side pressure: 0.5 MPa to 0.99 MPa (dry air) Maximum consumption: 0.3 L/min. (ANR) |
| Attribute | Value |
|---|---|
| Data Sheet | Click here to view |
