PZ2100A

Precision SMU mainframe that uncompromisingly and densely integrates a maximum of 20 SMU channels into a valuable 1U of rack space with flexible module options at their best performance

The Keysight PZ2100A is the precision source/measure unit (SMU) mainframe that uncompromisingly and densely integrates 20 SMU channels at maximum into valuable 1U height, full width, rack space with flexible module options at their best performance. It supports a variety of resources such as the Keysight PZ2110A High-Resolution SMU, PZ2120/21A High-Speed SMUs, and PZ2130/31A High-Channel Density SMUs with multiple functions such as pulser and digitizer, as well as precise voltage/current sourcing and measuring to adapt to a wide range of application requirements.

Scalable up to 20 ch, 20x higher density than conventional SMU

The PZ2100A integrates up to 20 SMU channels into valuable 1U-height, full-width rack space, and unlike conventional SMUs, it doesn’t require any cooling spacers when stacked.

Single-box solution simplifies synchronization with multiple SMUs at <50 ns accuracy

Its 6 internal trigger lines enable synchronization among the channels at less than 50 ns accuracy without any cabling. The external trigger ports allow its operation to synchronize with any external equipment flexibly and accurately.

5 SMU module options, flexibly configurable and upgradable

The PZ2100A has 4 slots and flexibly integrates 5 SMU module options. It allows any mixed module configuration, which enables you to configure and upgrade your test system flexibly according to your application requirement.

User-friendly graphical user interface, collectively managing 20 channels at max. accelerates test prototyping, debugging, and troubleshooting

The user-friendly GUI provides two view modes, collectively managing 20 channels at maximum. It enables you to select an appropriate view for your purpose to set and review the status of all the channels in a single interface

PZ2100A Key Benefits:

• Save cost and valuable rack space
• Wide application coverage from DC to dynamic measurements
• Simple integration and time efficiency