BT5525

BT5525

BT5525

Hioki

Detect contamination that could cause defects. Improve battery cell productivity through high-speed testing

Detect contamination that could cause defects and improve battery cell productivity through high-speed testing with the Hioki BT5525 Battery Insulation Tester

The Hioki BT5525 Battery Insulation Tester is ideal for battery production lines and offers Break Down Detection function for detecting minuscule short-circuits The BT5525 can prevent the shipment of batteries with latent defects that could lead to fires and also offers stable insulation resistance testing.

Hioki BT5525 Battery Insulation Tester Highlights:

  • Detecting minuscule insulation defects caused by contamination (Break Down Detect function)
  • Stable insulation resistance testing, even in noisy environments
  • Preventing testing do-overs due to erroneous judgments
  • Ideal for insulation resistance testing before battery electrolyte filling
  • Shorten cycle times with a maximum charging current of 50 mA
  • Compact footprint makes it easy to integrate the BT5525 into other systems
  • Invest in quality at a reasonable cost
  • PC application for analyzing waveforms
     

Battery Insulation Tester (25V to 500 V)

Detect contamination that could cause defects. Improve battery cell productivity through high-speed testing.

To assure battery quality over the long term, it’s necessary to detect the causes of latent defects in testing processes on production lines. Minuscule insulation defects can eventually degrade battery service life and cause fires. The principal causes of insulation defects are contamination (with metallic matter) and minuscule scratches occurring in production processes.

Break Down Detect Function (BDD)

Detecting minuscule insulation defects caused by contamination.

The BDD function is a proprietary testing function that can detect minuscule internal short-circuits caused by contamination (with metallic matter) at the stage before battery cells are filled with electrolytes. By identifying and eliminating defective parts at an early stage in the production process, the BDD function helps prevent the risk of hazards such as fires and accidents caused by heating after battery shipment. Eliminating latent accident causes such as these facilitates the production of batteries that resist degradation and function economically.

Proprietary method for reliably detecting contamination

The BDD function is a detection method that combines analogue circuitry (peak hold) with digital sampling (at 5 MS/s). It detects minuscule changes by monitoring the amount of change in voltage during charging and the amount of change in steady-state voltage and current after charging.

In this way, it resolves the issue of incomplete detection due to sampling timing and resolution, which affects waveform measurement using conventional oscilloscopes or recorders.

Stable insulation resistance testing, even in noisy environments

Hioki succeeded in significantly reducing the effects of external noise by drawing on insulation resistance tester measurement technology and design expertise cultivated over many years.

As a result, the BT5525 can perform stable, variation-free insulation resistance testing at a level of quality that lets it detect internal short circuits caused by contamination.

Contact us for lead time

Click below to request a quote for this item. Or for product advice, stock and lead time enquiries call our team on 0330 313 3220.

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Key Features
  • Ideal for battery production lines.
  • BDD function for detecting minuscule short-circuits caused by contamination before batteries are shipped.
  • Stable insulation resistance testing even in noisy environments.
  • High cost performance thanks to accessible pricing, high-speed testing, and compact footprint.
  • Contact check function reduces the number of false negatives caused by equipment issues.
Warranty 3 Year
Dimensions Approx. 8.46 IN W × 3.5 in H × 14.21 IN L 12.07, Approx. 2.8 Kilos (6.17 LBS)
Interface LAN / Ethernet, Other, RS-232, USB
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Data Sheet Click here to view

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