CT6700

CT6700

CT6700

Hioki

Current Probe CT6700 - High S/N characteristic ideal for ultra low 1 mA order current waveforms Clearly Observe Even 1 mA Waveforms

Hioki flat bandwidth current probes are best-in-class current sensors for use with Memory HiCorders and high performance oscilloscopes. The CT6700 is a high-sensitivity current probe that offers a wide DC to 50 MHz bandwidth and 5A of continuous input, and applications include capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe is designed with a high permeability magnetic shield to reduce the effects of electric fields, making it ideal for measuring low currents or nearby high-current lines.
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Key Features
  • Wide band: DC to 50 MHz (-3 dB)
  • High S/N characteristic ideal for ultra low 1 mA order current waveforms
  • Connect directly to an oscilloscope’s BNC input terminal (*1)
Basic Specifications
Frequency bandwidth DC to 50 MHz (-3 dB)
Rise time 7.0 ns or shorter
Noise level 60 μA rms typical, 75 μA rms max (for 30 MHz band measuring instrument)
Continuous allowable input 5 A rms (DC, and sine wave, requires derating at frequency)
Max. allowable peak input ±7.5 A peak (non-continuous)
Amplitude accuracy Typ.: ±1% rdg. ±1 mV (DC, 45 to 66 Hz sine wave, 0 to 5 A rms)
Guaranteed: ±3% rdg. ±1 mV (DC, 45 to 66 Hz sine wave, 0 to 5 A rms)
Output rate 1 V/A (The output of this probe is internally terminated)
Measurable conductors Insulated conductor
Core diameter φ 5 mm (0.20 in)
Power supply ±12 V ±0.5 V, 3.2 VA
Dimensions and mass Sensor: 155 mm (6.10 in)W × 18 mm (0.71 in)H × 26 mm (1.02 in)D, Terminator: 29 mm (1.14 in)W × 83 mm (3.27 in)H × 40 mm (1.57 in)D mm, Mass: 250 g (8.8 oz), Sensor cable BNC terminal: 1.5 m (4.92 ft), Power cable: 1 m (3.28 ft), Power plug: FFA.0S.304.CLAC37Y / LEMO inc.
Accessories Instruction manual ×1, Carrying case ×1
Accessory Type Probe
Notes Use optional Power Supply 3269 or 3272 to drive the current probe when power from the Memory HiCorder or oscilloscope is not available.Exercise care concerning offset drift when performing continuous measurement over extended periods of time.
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Data Sheet Click here to view

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