SCN-564/3G

EMC scanner system in 4D including probe kit for 3 GHz

The SCN series comes in three different sizes to fit most DUTs and combines very-high scan resolution of 0.1 mm with probe head rotation, and the best-in-class scanning SW to deliver powerful visualization of the EMC test. For boards with components of substantially different heights, the optional laser distance meter will enable you to follow the DUT’s topography and measure at a fixed distance from the DUT, automatically creating a precise 3D-model of the DUT.

Key Features:

In R&D

Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct.

If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.

Similarly, if your problem was immunity, you can (optionally) scan for sensitive areas and repeat measurements while strengthening your product.

You can compare different design solutions and make comparative measurements of electromagnetic emissions.

In QC

The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier of a component doesn’t affect the emission spectra in a negative way.