HI-1592

HI-1592

HI-1592

Holt Integrated Circuits

Radiation-Hard MIL-STD-1553 3.3V Dual Transceiver

Radiation-Hardened, Hermetically Packaged MIL-STD-1553 Dual Transceiver

The HI-1592 is a radiation-hardened, hermetically packaged MIL-STD-1553 dual transceiver designed for use in high-reliability MIL-STD-1553 applications, such as launch vehicles, high-altitude aircraft and space.

As aircraft fly at higher altitudes or in space they become more susceptible to exposure to cosmic rays, resulting in effects such as single-event transient (SET), single-event functional interrupt (SEFI), single-event latch-up (SEL) and single-event burnout (SEB), any of which could result in degradation or failure of electronic equipment. To that end, electronic equipment designed to fly in these environments needs some level of latch-up immunity or radiation hardness assurance (RHA) against the effects of cosmic rays.

The HI-1592 is designed to provide latch-up immunity up to an LET of 67.7 MeV-cm2/mg and an RHA total ionizing dose (TID) of 100 krad(Si). It is ideal for launch vehicle and high-altitude aircraft applications utilizing MIL-STD-1553 data bus communication.

The device also features 1.8V, 2.5V and 3.3V compatible digital I/O, making it easier to interface with a broader range of FPGAs and controllers.

The transmitter takes complementary CMOS / TTL Manchester II bi-phase data and converts it to differential voltages suitable for driving the bus isolation transformer. Separate transmitter inhibit control signals are provided for each bus. The receiver section of the each bus converts the 1553 bus bi-phase analogue signals to complementary CMOS / TTL data suitable for input to a Manchester decoder. Each receiver has a separate enable input, which forces the receiver outputs to the bus idle state (logic "0") when low.

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More Information
Attribute Value
Voltage at BUSA/B or BUSA/B pins +/-7 V
VDDIO − VDD1P8 0.5V
Reflow Solder Temperature 260°C
Junction Temperature 175°C
Key Features
  • Robust Silicon-On-Insulator (SOI) CMOS technology
  • RHA Total Ionizing Dose (TID)
    • 100 krad(Si) High Dose Rate
  • Single-Event Effect (SEE) hardness
    • SEB and SEL free up to 67.7 MeV-cm2/mg
    • SET and SEFI characterized up to 67.7 MeV-cm2/mg
  • MIL-PRF-38535 compliant
  • 1.8V, 2.5V and 3.3V compatible digital I/O
  • Extended temperature range with optional burn-in
Storage Temperature -65°C to +150°C
Product_Parts

HI-1592CST

HI-1592CSD

More Information
Attribute Value
Data Sheet Click here to view