Hioki RM3542A Resistance Meter | APC Technology Group

RM3542A

RM3542A

Hioki

Resistance Meter

High-Speed Resistance Meter Ideal for Automated Lines; Compatible with Super-Small Electronic Components

Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3542A delivers high-speed and high-stability measurements and improved productivity by minimizing variations and reducing contact errors. In addition, the low-impact measurement technology lets you measure resistance for miniature 008004-size electronic parts. 

Key Features

  • Applied voltage limit function lets you switch the detection voltage to 5 V or less
  • Contact improvement function suppresses rush current to aid in probing of super-small components
  • Extensive selection of measurement ranges ensures the right detection voltage and delivers stable measurement
  • Scaling function corrects for mounting state and test stage differences
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More Information
Attribute Value
Power Supply 100 to 240 V AC, 50/60 Hz, 30 VA max.
Included Accessories Power cord ×1, EXT. I/O male connector ×1, Instruction manual ×1, Operation guide ×1
Display Monochrome graphic LCD 240 × 64 dot, white LED backlight
Interfaces RS-232C, Printer, GP-IB (Model RM3542-51)
Accuracy

[with SLOW mode, at 100 mΩ range] ±0.015 % rdg. ±0.002 % f.s.

[with SLOW mode, at 1000 Ω range] ±0.006 % rdg. ±0.001 % f.s. (best case)

Measurement Times

[at 100 Ω /1000 Ω ranges, with Low Power OFF]

FAST: 0.9 ms, MED: 3.6 ms, SLOW: 17 ms (minimum time)

Resistance Measurement Ranges

[at Low Power OFF] 100 mΩ range (Max. 120.0000 mΩ, 0.1 μΩ resolution) to 100 MΩ range (Max. 120.0000 MΩ, 100 Ω resolution), 16 steps

[at Low Power ON] 1000 mΩ range (Max. 1200.000 mΩ, 1 μΩ resolution) to 1000 Ω range (Max. 1200.000 Ω, 1 mΩ resolution), 6 steps

Testing Current [at 100 mΩ range] 100 mA DC to [at 100 MΩ range] 100 nA DC
Open-Terminal Voltage 20 V DC max. (with applied voltage limit function enabled: max. 10 V DC)
More Information
Attribute Value
Data Sheet Click here to view

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