Search results for: 'reliability type synchronisation and tester'

3DEE2M08CS2097

5V, 2 Mbit Memory Module: EEPROM organised as 256K x8, based on 128K x8

3DEE4M08VS4145

3.3V, 4 Mbit Memory Module: 8-bit bus width, EEPROM based on 128K x8

3DEE4M32VS4162

3.3V, 4 Mbit Memory Module: 32-bit bus width, EEPROM based on 128K x8

3DEE4M32CS4102

5V, 4 Mbit Memory Module: EEPROM organised as 128K x32, based on 128K x8

3DEE5M40VS5257

3.3V, 5 Mbit Memory Module: 30-bit bus width, EEPROM based on 128K x8

3DEE5M40CS5175

5V, 5 Mbit Memory Module: EEPROM organised as 128K x40, based on 128K x8

3DEE8M08VS8190

3.3V, 8 Mbit Memory Module: 8-bit bus width, EEPROM based on 128K x8

3DEE8M08CS8020

5V, 8 Mbit Memory Module: EEPROM organised as 1M x8, based on 128K x8

3DEE8M32VS8094

3.3V, 8 Mbit Memory Module: 32-bit bus width, EEPROM based on 128K x8

3DFN8G08VS1706

3.3V, 8 Gbit Memory Module: 8-bit bus width, NAND Flash based on 1G x 8