The Hioki electrical safety testers are designed for insulation resistance and voltage withstand testing of electrical devices and components according to various safety standards. The ST5520 is the fastest insulation tester in the industry, delivering pass/fail assessment in as fast as 50 ms. 25 V to 1000 V test voltage with 1 V resolution.
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Freely configurable test voltage (set from 25 V to 1000 V, 1 V resolution)
Contact check function (prevents errors due to poor contact)
Short-circuit check function (stops potential defects from reaching the market)
Ideal for battery production lines
Basic Specifications
Measurement items
Insulation resistance (Applied DC voltage method)
Testing voltage
(Measurement range: AUTO/MANUAL setting is possible)
25 V ≤ V < 100 V (2.000/20.00/200.0 MΩ),
100 V ≤ V < 500 V (2.000/20.00/200.0/2000 MΩ),
500 V ≤ V ≤ 1000 V (2.000/20.00/200.0/4000 MΩ)
Basic accuracy
±2 % rdg. ±5 dgt.
25 V ≤ V < 100 V [0 to 20 MΩ]
100 V ≤ V < 500 V [0 to 20 MΩ]
500 V ≤ V ≤ 1000 V [0 to 20 MΩ]
Saved items: rated measurement voltage, comparator upper limit /lower limit values, test mode, beep sound to distinguish the result, test time, response time, resistance range, measurement speed
Memory capacity: up to 10 items (can be saved/loaded)
Comparator setting
UPPER_FAIL: Measured value ≥ upper limit value
PASS: Upper limit value > measured value > lower limit value
LOWER_FAIL: Measured value ≤ lower limit value
Judgement process
Beep sound, PASS / U.FAIL/L. FAIL: light up on LED display, When UL_FAIL, U.FAIL / L.FAIL light up simultaneously, EXT.I/O output, judgement result can be obtained via RS-232C
Test duration
Definition of test duration: Test duration = Response time + Measurement time
Function: Set the time from voltage application until pass/fail assessment
Configuration range: 0.045 s to 999.999 s (0.001 s resolution)
Response time timer
After the start of the test, comparator judgment operation can be prohibited until a set interval from 0.005 sec. to 999.999 sec. (at 0.001 sec. resolution) has passed.
